求助一篇IEICE文献An Analysis of and a Method of Enhancing the Intensity of OBIRCH Signal for Defects Observation in VLSI Metal Interconnections作者:N Kawamura,T Sakai,M Shimaya - IEICE transactions on …,1994 - search.ieice.org摘要:The
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求助一篇IEICE文献An Analysis of and a Method of Enhancing the Intensity of OBIRCH Signal for Defects Observation in VLSI Metal Interconnections作者:N Kawamura,T Sakai,M Shimaya - IEICE transactions on …,1994 - search.ieice.org摘要:The
求助一篇IEICE文献
An Analysis of and a Method of Enhancing the Intensity of OBIRCH Signal for Defects Observation in VLSI Metal Interconnections
作者:N Kawamura,T Sakai,M Shimaya - IEICE transactions on …,1994 - search.ieice.org
摘要:The origin of and a method of enhancing the Optical Beam Induced Resistance Change
(OBIRCH) signal for defect observation in VLSI metal interconnections is discussed based
on a numerical analysis of three-dimensional thermal conduction and experimental results ...
这三篇文章同样是在IEICE上面,
Failure Analysis in Si Device Chips
作者:Kiyoshi NIKAWA
Highly Sensitive OBIRCH System for Fault Localization and Defect Detection
作者:Kiyoshi NIKAWA,Shoji INOUE,
Optical Beam Induced Current Technique as a Failure Analysis Tool of EPROMs
作者:Jun SATOH,Hiroshi NAMBA,Tadashi KIKUCHI,Kenichi YAMADA,Hidetoshi YOSHIOKA,Miki TANAKA,Ken SHONO,
求助一篇IEICE文献An Analysis of and a Method of Enhancing the Intensity of OBIRCH Signal for Defects Observation in VLSI Metal Interconnections作者:N Kawamura,T Sakai,M Shimaya - IEICE transactions on …,1994 - search.ieice.org摘要:The
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An Analysis of and a Method of Enhancing the Intensity of OBIRCH Signal for Defects Observation in VLSI Metal Interconnections